Thermal Property Measurement & Scientific Consulting
We provide measurements of the thermal transport properties of materials for industrial and academic research
Measurement Services
Materials Testing Services
Select a metrology technique below to review specifications, sample constraints, and measurement regimes.
Nanoscale Thermal Transport by Time-Domain Thermoreflectance (TDTR)
Measurement of thermal conductivity and interface conductance using picosecond pump-probe metrology.
Microscale Thermal Properties by Displacement Thermo-Optic Phase Spectroscopy (D-TOPS)
Simultaneous determination of thermal conductivity and the coefficient of thermal expansion (CTE) in small specimens and layers as thin as 1 µm.
Liquid Thermal Conductivity by I-TOPS
Immersion thermo-optic phase spectrocopy (I-TOPS) enables the measurement of extremely small volumes.
Thermal Boundary Resistance (TBR)
Non-destructive measurement of thermal boundary resistance in wafer-bonded interfaces and 3D integrated circuit die assemblies with probing depths up to 100 µm.
Materials Analysis & Characterization
Supporting characterization including picosecond acoustics, Rutherford backscattering spectrometry, X-ray reflectivity, and spectroscopic ellipsometry.
Measurement and Understanding of Thermal Transport in Novel Materials
Drawing on 40 years of experience, we provide expert advice on the physical behavior of materials and the measurement of their thermophysical properties.
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