About Cahill Thermal, LLC

We deliver quantitative thermal transport data and expert consulting on the measurement of thermophysical properties for academic and industrial research.

Cahill Thermal provides measurements of thermal conductivity, thermal boundary resistance, and coefficient of thermal expansion. We utilize time-domain thermoreflectance (TDTR) and thermo-optic phase spectroscopy (D-TOPS and I-TOPS) to characterize thin films, interfaces, and bulk materials.

Heat transport in microelectronic and nanostructured materials is often governed by internal boundaries. Our optical thermometry techniques isolate cross-plane thermal conductivity, interfacial thermal conductance, and linear thermal expansion coefficients across wide temperature and modulation frequency ranges. We work directly with academic and industrial research teams to deliver high quality data on materials that are inaccessible to conventional techniques.

Core Expertise & Measurement Methods

Non-Contact Optical Metrology

High throughput and spatially-resolved measurements using ultrafast pump-probe and modulated beam deflection techniques.

Extended Probing Depth

Capability for probing buried thermal interfaces in 3D integrated circuit die stacks at depths up to ~100 µm beneath the surface.

Sub-Micron Thin-Film Metrology

Resolves cross-plane thermal conductivity and interface thermal conductance in thin films spanning nanometer to micron thicknesses.

Materials Characterization

Supports thermal transport data with measurements of layer thickness, elastic constants, and composition.

Specialized Research & Custom Configurations

We collaborate with research groups and engineering teams to address complex problems in the thermal sciences and unconventional sample geometries.